VLSI Test Principles and Architectures - Design for Testability

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Features & Benefits

• Most up-to-date coverage of design for testability.
• Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
• Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
• Lecture slides for Chapters 1-5 and exercise solutions for Chapters 1, 2, 3 & 5 are available now.
• Lecture slides and exercise solutions for the remaining chapters will be available by September 15, 2006.